Articles | Volume 12, issue 7
https://doi.org/10.5194/tc-12-2371-2018
https://doi.org/10.5194/tc-12-2371-2018
Research article
 | 
20 Jul 2018
Research article |  | 20 Jul 2018

On the reflectance spectroscopy of snow

Alexander Kokhanovsky, Maxim Lamare, Biagio Di Mauro, Ghislain Picard, Laurent Arnaud, Marie Dumont, François Tuzet, Carsten Brockmann, and Jason E. Box

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AR: Author's response | RR: Referee report | ED: Editor decision
AR by Alexander Kokhanovsky on behalf of the Authors (20 Jun 2018)  Manuscript 
ED: Publish subject to minor revisions (review by editor) (03 Jul 2018) by Benjamin Smith
AR by Alexander Kokhanovsky on behalf of the Authors (05 Jul 2018)  Manuscript 
ED: Publish as is (09 Jul 2018) by Benjamin Smith
AR by Alexander Kokhanovsky on behalf of the Authors (12 Jul 2018)  Manuscript 
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Short summary
This work presents a new technique with which to derive the snow microphysical and optical properties from snow spectral reflectance measurements. The technique is robust and easy to use, and it does not require the extraction of snow samples from a given snowpack. It can be used in processing satellite imagery over extended fresh dry, wet and polluted snowfields.